Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage

Nanoscope III SPM and controller

LSS large sample scanning stage allows imaging on samples up to 8"x8" with 6"x6" XY travel.

Samples up to 1.25" thick

Includes 850x optical microscope and fully automated stage for locating features.

optical microscope for defining the region to be scanned

acoustic enclosure,

DMLS probe

PC, flat panel monitors