Newport Oriel IQE200 PV efficiency test system (2013) with extended range, 300-1800nm

Newport Oriel IQE200 PV efficiency test system (2013) with extended range, 300-1800nm

$24,900 (USD)

Description

Manufacture date 03/2013

Simultaneous EQE, IQE measurements

IQE-AC-XEN-EXT1 with Xenon source and Extended range 300-1800nm serial no. 016

Light biasing kit with 66088 QTH power supply and bifurcated fiber optic cable

Temperature controlled vacuum chuck PVIV-TC-VAC with chiller and vacuum pump

includes 4 electrical contact probes

Newport 71619 detector

Si and Ge test samples with data

The IQE-200 permits simultaneous measurement of both the external quantum efficiency (EQE) and the internal quantum efficiency (IQE) of solar cells, detectors and any photon-to-charge converting devices. The integrated and patent-pending measurement system incorporates detector geometry that splits the beam, allowing for concurrent measurements.

Wavelength range is from 300 to 1100 nm, working distance is 50 mm, resolution is 5 nm (adjustable), and repeatability is <±0.5. The light source is a 250-W quartz tungsten halogen lamp. Operating temperature is from 0 to 40 °C, input voltage is from 90 to 264 VAC, input current is 15 A, and power consumption is 400 W.

The photovoltaic cell measurement system combines the durable light source, a monochromator, advanced sensor technology, and related electronics and software. The Oriel QE Commander software, preloaded on a PC, is designed to control all the components and accessories, providing simultaneous real-time readout of EQE and IQE in a single measurement with the press of one button. The preconfigured calibrated assembly with four-channel data acquisition for rapid measurement is a turnkey solution.

The AC measurements are performed in accordance with ASTM 1021-06 guidelines, offering reliable operation and easy installation with minimal setup time.

The cost-effective Oriel IQE-AC-QTH-SI is the first product in the IQE-200 family of systems for measuring total solar cell quantum efficiencies. It is suitable for the measurement of silicon-based cells, both amorphous and mono/poly crystalline, thin film cells, copper indium gallium diselenide, cadmium telluride and more.

Specifications

Stock Number3823
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