Nanometrics Accent QS1200 FTIR metrology (2008)

$39,500.00
$39,500.00
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Nanometrics Accent QS1200 FTIR metrology (2008)
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Nanometrics Accent QS1200 FTIR metrology (2008)
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Nanometrics Accent QS1200 FTIR metrology (2008)
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Nanometrics Accent QS1200 FTIR metrology (2008)
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Nanometrics Accent QS1200 FTIR metrology (2008)
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Nanometrics Accent QS1200 FTIR metrology (2008)
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Nanometrics Accent QS1200 FTIR metrology (2008)
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Nanometrics Accent QS1200 FTIR metrology (2008)

RF-3399

The QS 1200 FTIR metrology tool is a desktop system for dopant monitoring, epi thickness measurement, and other applications.

QS 1200 is specifically designed for advanced semiconductor fabs performing material characterization in silicon growing and device manufacturing areas.

It provides a new level of integration of the FTIR technique utilizing proven optical technology,

Manual wafer tray to accommodate SEMI standard wafers of 100, 125, 150, 200 and 300 mm diameter. 

Operating system Windows XP.

Manufacture date 2008

See PDF link below for complete specifications

NanometricsQS1200.pdf

Last updated: 06/12/2018

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